Early detection study of Kidney Organ Complication caused by Diabetes Mellitus using iris image color constancy


Diabetes Mellitus is now becoming a mass silent killer in the society because it does not show any signs previously to the patients until it has been in the dangerous level. Most people just realize their diabetic condition when the stage was already too late. In many cases, Diabetes Mellitus causes many complications to other organs, such as kidney, cardiovascular, liver or blood pressure. This study is analyzing the early stage of kidney complication caused by Diabetes Mellitus by analyzing iris image of the patient. Nowadays, there have been several tools that can be used to analyze the condition of patient kidney including blood test. However, a new approach is needed for a faster, simpler and non-invasive detection system. Iridology is a new branch of science that studying the condition of human organ via iris image. Based on Iridology, the structures of iris fibers are relating to the condition of certain organ in human body. This study is exploring the relationship of Kidney organ complication with the iris fibers structures (image of iris) and validated the result with patient’s medical records. An existing iris chart introduced by Bernard Jensen was used to analyze the Kidney organ condition. The location of kidney organ in iris is at 200° – 210° when image of iris was devided by 360°. Image of iris was taken by using a specific iris camera. Region of interest (ROI) was then determined by using the iris chart. Color constancy and independent component analysis were used to analize the ROI of iris image. Broken tissue in iris image would be the feature for detecting the complication of kidney organ. From 47 participants, the result showed that 76% of participants showing a relation of kidney’ complication with their iris image. This result conclude that iris image analysis can be used as an alternative way in monitoring the condition of internal organ such as kidney’s complication.
Date of Conference: 12-12 Oct. 2016
Date Added to IEEE Xplore: 27 April 2017

Leave a Reply

Your email address will not be published. Required fields are marked *

Please slide to verify that you are human *